ELES

Cost Effective Automated Burn-In Test solutions for the reduction of Time-to-Market and the improvement of Process Yield.

• Design Validation
• Product and Process Qualification
• Application and Test Program Development
• Integrated Functional Test with Package and Wafer Level Burn-in - optimized for DFT methodologies.
• WLBI Vertical Probe Card technology

FTS Systems

Thermal Air Systems and Industrial Chillers

• Cascade refrigeration design – low maintenance
• Floor and bench top models with Full Mil-spec capabilities
• CD and TUV Certified
• Industrial Air & Liquid Chiller Systems

Phoenix Test Arrays

High Performance Test Sockets

• Non pogo pin solutions
• Bandwidths greater than 40Ghz @ 1dB
• Lead free solutions
• Simple maintenance
• > 20 yrs experience

SUSS MicroTec

Analytical Probe Stations

• Automated and Manual Systems
• Front and Back-Side Probing Capability
• Low Leakage, Pressure, and Vacuum Systems
• Test Head and PCB/Motherboard Probing Systems
• Most Stable and Highest Accuracy on the Market